Information card for entry 7704173

Structure parameters

• Formula: C39 H44 Hf N2 Si
• Calculated formula: C39 H44 Hf N2 Si
• SMILES: [Hf]12(N([Si](c3[n]1c(ccc3)c1c2cccc1)(C)C)c1c(cccc1C(C)C)C(C)C)(Cc1ccccc1)Cc1ccccc1
• Title of publication: Pyridylamido hafnium complexes with a silylene bridge: synthesis and olefin polymerization.
• Authors of publication: Kulyabin, Pavel S.; Uborsky, Dmitry V.; Voskoboynikov, Alexander Z.; Canich, Jo Ann M.; Hagadorn, John R.
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2020
• Journal volume: 49
• Journal issue: 20
• Pages of publication: 6693 - 6702
• a: 17.825 ± 0.0009 Å
• b: 11.1737 ± 0.0006 Å
• c: 18.7813 ± 0.0009 Å
• α: 90°
• β: 115.091 ± 0.001°
• γ: 90°
• Cell volume: 3387.7 ± 0.3 ų
• Cell temperature: 120 K
• Ambient diffraction temperature: 120 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for all reflections: 0.0301
• Residual factor for significantly intense reflections: 0.0243
• Weighted residual factors for significantly intense reflections: 0.0567
• Weighted residual factors for all reflections included in the refinement: 0.0586
• Goodness-of-fit parameter for all reflections included in the refinement: 1.055
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No