Information card for entry 7704579

Structure parameters

• Formula: C18 H32 N2 O4 Sn
• Calculated formula: C18 H32 N2 O4 Sn
• SMILES: C1(=CC(C)=[N](CCCOC)[Sn]2([N](=C(C=C(C)O2)C)CCCOC)O1)C
• Title of publication: Additive-free spin coating of tin oxide thin films: synthesis, characterization and evaluation of tin β-ketoiminates as a new precursor class for solution deposition processes.
• Authors of publication: Huster, Niklas; Zanders, David; Karle, Sarah; Rogalla, Detlef; Devi, Anjana
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2020
• Journal volume: 49
• Journal issue: 31
• Pages of publication: 10755 - 10764
• a: 8.28458 ± 0.00009 Å
• b: 15.15852 ± 0.00017 Å
• c: 16.5128 ± 0.0002 Å
• α: 90°
• β: 94.1801 ± 0.0011°
• γ: 90°
• Cell volume: 2068.19 ± 0.04 ų
• Cell temperature: 99.99 ± 0.1 K
• Ambient diffraction temperature: 99.99 ± 0.1 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.0331
• Residual factor for significantly intense reflections: 0.031
• Weighted residual factors for significantly intense reflections: 0.0818
• Weighted residual factors for all reflections included in the refinement: 0.0833
• Goodness-of-fit parameter for all reflections included in the refinement: 1.061
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No