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Information card for entry 7704754
Preview
Coordinates | 7704754.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | Cl6 Cu4 H4 K N O6 Te2 |
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Calculated formula | Cl6 Cu4 H4 K N O6 Te2 |
Title of publication | Synthesis, crystal structures, and magnetic properties of one-dimensional alkali metal copper chlor-tellurites A(NH<sub>4</sub>)Cu<sub>4</sub>Te<sub>2</sub>O<sub>6</sub>Cl<sub>6</sub> (A = K, Cs), NaCu<sub>4</sub>Te<sub>2</sub>Cl<sub>5</sub>O<sub>6</sub> and Rb<sub>3</sub>(NH<sub>4</sub>)<sub>2</sub>Cu<sub>12</sub>Te<sub>6</sub>Cl<sub>16.5</sub>O<sub>18</sub>(OH)<sub>0.5</sub>. |
Authors of publication | Zhu, Bei; Jiang, Jianhua; Zhu, Tianyu; Yang, Haoming; Jin, Yong; Lü, Minfeng |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2020 |
Journal volume | 49 |
Journal issue | 28 |
Pages of publication | 9751 - 9761 |
a | 8.7465 ± 0.0004 Å |
b | 9.1357 ± 0.0004 Å |
c | 10.0174 ± 0.0005 Å |
α | 90° |
β | 90.648 ± 0.004° |
γ | 90° |
Cell volume | 800.39 ± 0.06 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 7 |
Space group number | 12 |
Hermann-Mauguin space group symbol | C 1 2/m 1 |
Hall space group symbol | -C 2y |
Residual factor for all reflections | 0.1115 |
Residual factor for significantly intense reflections | 0.0775 |
Weighted residual factors for significantly intense reflections | 0.0865 |
Weighted residual factors for all reflections included in the refinement | 0.1105 |
Goodness-of-fit parameter for significantly intense reflections | 3.38 |
Goodness-of-fit parameter for all reflections included in the refinement | 3.67 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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