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Information card for entry 7705044
Preview
Coordinates | 7705044.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C61 H71 B F15 Li N2 O4 Te |
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Calculated formula | C61 H71 B F15 Li N2 O4 Te |
SMILES | [Te]=C1N(c2c(cccc2C(C)C)C(C)C)C(=CN1c1c(C(C)C)cccc1C(C)C)[B](c1c(F)c(F)c(F)c(F)c1F)(c1c(F)c(F)c(F)c(F)c1F)c1c(F)c(F)c(F)c(F)c1F.O1(CCCC1)[Li]([O]1CCCC1)([O](CC)CC)[O](CC)CC |
Title of publication | Chalcogen complexes of anionic N-heterocyclic carbenes. |
Authors of publication | Ho, Luong Phong; Körner, Lukas; Bannenberg, Thomas; Tamm, Matthias |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2020 |
Journal volume | 49 |
Journal issue | 38 |
Pages of publication | 13207 - 13217 |
a | 13.18 ± 0.0004 Å |
b | 14.511 ± 0.0004 Å |
c | 16.99 ± 0.0004 Å |
α | 100.74 ± 0.002° |
β | 103.21 ± 0.002° |
γ | 92.73 ± 0.002° |
Cell volume | 3094.17 ± 0.15 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0436 |
Residual factor for significantly intense reflections | 0.0431 |
Weighted residual factors for significantly intense reflections | 0.1179 |
Weighted residual factors for all reflections included in the refinement | 0.1184 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.049 |
Diffraction radiation wavelength | 1.5418 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7705044.html
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Users of the data should acknowledge the original authors of the
structural data.