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Information card for entry 7705409
Preview
Coordinates | 7705409.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C43 H37 N2 O5 P2 Rh |
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Calculated formula | C43 H37 N2 O5 P2 Rh |
SMILES | [Rh]([P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)([n]1ccc(cc1)CO)C#[O].O=N(=O)[O-] |
Title of publication | Systematic evaluation of the electronic effect of aluminum-containing ligands in iridium-aluminum and rhodium-aluminum bimetallic complexes. |
Authors of publication | Charles, R. Malcolm; Taylor, Natalie S.; Mercado, Angel A.; Frost, Connor E.; Yokley, Timothy W.; Eckenhoff, William T.; Schley, Nathan D.; DeYonker, Nathan J.; Brewster, Timothy P. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2020 |
Journal volume | 49 |
Journal issue | 37 |
Pages of publication | 13029 - 13043 |
a | 19.1625 ± 0.0006 Å |
b | 11.3328 ± 0.0003 Å |
c | 18.6157 ± 0.0006 Å |
α | 90° |
β | 110.478 ± 0.003° |
γ | 90° |
Cell volume | 3787.2 ± 0.2 Å3 |
Cell temperature | 100 ± 0.2 K |
Ambient diffraction temperature | 100 ± 0.2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0461 |
Residual factor for significantly intense reflections | 0.0368 |
Weighted residual factors for significantly intense reflections | 0.0723 |
Weighted residual factors for all reflections included in the refinement | 0.0771 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7705409.html
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