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Information card for entry 7705411
Preview
Coordinates | 7705411.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C43 H37 N2 O5 P2 Rh |
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Calculated formula | C43 H37 N2 O5 P2 Rh |
SMILES | [Rh]([P](c1ccccc1)(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)([n]1cc(ccc1)CO)C#[O].O=N(=O)[O-] |
Title of publication | Systematic evaluation of the electronic effect of aluminum-containing ligands in iridium-aluminum and rhodium-aluminum bimetallic complexes. |
Authors of publication | Charles, R. Malcolm; Taylor, Natalie S.; Mercado, Angel A.; Frost, Connor E.; Yokley, Timothy W.; Eckenhoff, William T.; Schley, Nathan D.; DeYonker, Nathan J.; Brewster, Timothy P. |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2020 |
Journal volume | 49 |
Journal issue | 37 |
Pages of publication | 13029 - 13043 |
a | 9.908 ± 0.0004 Å |
b | 11.2551 ± 0.0005 Å |
c | 17.8041 ± 0.0007 Å |
α | 108.05 ± 0.004° |
β | 95.964 ± 0.003° |
γ | 94.62 ± 0.004° |
Cell volume | 1864.11 ± 0.14 Å3 |
Cell temperature | 100.01 ± 0.1 K |
Ambient diffraction temperature | 100.01 ± 0.1 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0631 |
Residual factor for significantly intense reflections | 0.0467 |
Weighted residual factors for significantly intense reflections | 0.0875 |
Weighted residual factors for all reflections included in the refinement | 0.0945 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.053 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7705411.html
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Users of the data should acknowledge the original authors of the
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