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Information card for entry 7705556
Preview
Coordinates | 7705556.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H72 N6 O Si4 Sn2 |
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Calculated formula | C36 H72 N6 O Si4 Sn2 |
SMILES | [Sn]1([N](CCN1c1ccccc1Oc1ccccc1N1[Sn]([N](CC1)(CC)CC)N([Si](C)(C)C)[Si](C)(C)C)(CC)CC)N([Si](C)(C)C)[Si](C)(C)C |
Title of publication | Ditopic bis(<i>N</i>,<i>N</i>',<i>N</i>'-substituted 1,2-ethanediamine) ligands: synthesis and coordination chemistry. |
Authors of publication | Rösch, Andreas; Herzog, Christoph M.; Schreiner, Simon H. F.; Görls, Helmar; Kretschmer, Robert |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2020 |
Journal volume | 49 |
Journal issue | 39 |
Pages of publication | 13818 - 13828 |
a | 13.8445 ± 0.0002 Å |
b | 17.9944 ± 0.0002 Å |
c | 18.8137 ± 0.0002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 4686.93 ± 0.1 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 6 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0183 |
Residual factor for significantly intense reflections | 0.0178 |
Weighted residual factors for significantly intense reflections | 0.0428 |
Weighted residual factors for all reflections included in the refinement | 0.0431 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
Diffraction radiation wavelength | 1.39222 Å |
Diffraction radiation type | CuKβ |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7705556.html
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