Information card for entry 7708245

Structure parameters

• Formula: C12 H28 N2 O2 Sn
• Calculated formula: C12 H28 N2 O2 Sn
• Title of publication: Evaluation of Sn(II) Aminoalkoxide Precursors for Atomic Layer Deposition of SnO Thin Films. Invitation: Dalton Transactions web collection themed around the topic of tin chemistry
• Authors of publication: Johnson, Andrew Lee; Paish, James David; Snook, Michael
• Journal of publication: Dalton Transactions
• Year of publication: 2021
• a: 8.1592 ± 0.0003 Å
• b: 13.8664 ± 0.0005 Å
• c: 14.1626 ± 0.0005 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 1602.34 ± 0.1 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 5
• Space group number: 19
• Hermann-Mauguin space group symbol: P 21 21 21
• Hall space group symbol: P 2ac 2ab
• Residual factor for all reflections: 0.0283
• Residual factor for significantly intense reflections: 0.0252
• Weighted residual factors for significantly intense reflections: 0.0422
• Weighted residual factors for all reflections included in the refinement: 0.043
• Goodness-of-fit parameter for all reflections included in the refinement: 1.051
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No