Information card for entry 7708247

Structure parameters

• Formula: C22 H60 N4 O2 Si4 Sn2
• Calculated formula: C22 H60 N4 O2 Si4 Sn2
• Title of publication: Evaluation of Sn(II) Aminoalkoxide Precursors for Atomic Layer Deposition of SnO Thin Films. Invitation: Dalton Transactions web collection themed around the topic of tin chemistry
• Authors of publication: Johnson, Andrew Lee; Paish, James David; Snook, Michael
• Journal of publication: Dalton Transactions
• Year of publication: 2021
• a: 20.5372 ± 0.0001 Å
• b: 12.1856 ± 0.0001 Å
• c: 14.3785 ± 0.0001 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 3598.34 ± 0.04 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 6
• Space group number: 29
• Hermann-Mauguin space group symbol: P c a 21
• Hall space group symbol: P 2c -2ac
• Residual factor for all reflections: 0.043
• Residual factor for significantly intense reflections: 0.0426
• Weighted residual factors for significantly intense reflections: 0.1115
• Weighted residual factors for all reflections included in the refinement: 0.1119
• Goodness-of-fit parameter for all reflections included in the refinement: 1.065
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: Yes
• Has Fobs: No