Information card for entry 7708252

Structure parameters

• Formula: C8 H20 N2 O2 Sn
• Calculated formula: C8 H20 N2 O2 Sn
• Title of publication: Evaluation of Sn(II) Aminoalkoxide Precursors for Atomic Layer Deposition of SnO Thin Films. Invitation: Dalton Transactions web collection themed around the topic of tin chemistry
• Authors of publication: Johnson, Andrew Lee; Paish, James David; Snook, Michael
• Journal of publication: Dalton Transactions
• Year of publication: 2021
• a: 11.8081 ± 0.0002 Å
• b: 10.1306 ± 0.0002 Å
• c: 10.0735 ± 0.0002 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 1205.02 ± 0.04 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 0.1 K
• Number of distinct elements: 5
• Space group number: 41
• Hermann-Mauguin space group symbol: A e a 2
• Hall space group symbol: A 2 -2ab
• Residual factor for all reflections: 0.0287
• Residual factor for significantly intense reflections: 0.0255
• Weighted residual factors for significantly intense reflections: 0.0509
• Weighted residual factors for all reflections included in the refinement: 0.0521
• Goodness-of-fit parameter for all reflections included in the refinement: 1.211
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No