Information card for entry 7708405
Formula |
C34 H86 O4 Si6 Sn2 Yb |
Calculated formula |
C34 H86 O4 Si6 Sn2 Yb |
Title of publication |
Bonding analysis in ytterbium(ii) distannyl and related tetryls |
Authors of publication |
Chapple, Peter M.; Cartron, Julien; Hamdoun, Ghanem; Cordier, Marie; Kahlal, Samia; Oulyadi, Hassan; Carpentier, Jean-François; Saillard, Jean-Yves; Sarazin, Yann |
Journal of publication |
Dalton Transactions |
Year of publication |
2021 |
a |
13.2657 ± 0.0008 Å |
b |
19.8289 ± 0.0011 Å |
c |
40.652 ± 0.002 Å |
α |
90° |
β |
90° |
γ |
90° |
Cell volume |
10693.3 ± 1 Å3 |
Cell temperature |
150 K |
Ambient diffraction temperature |
150 K |
Number of distinct elements |
6 |
Space group number |
61 |
Hermann-Mauguin space group symbol |
P b c a |
Hall space group symbol |
-P 2ac 2ab |
Residual factor for all reflections |
0.0577 |
Residual factor for significantly intense reflections |
0.0378 |
Weighted residual factors for significantly intense reflections |
0.0739 |
Weighted residual factors for all reflections included in the refinement |
0.0801 |
Goodness-of-fit parameter for all reflections included in the refinement |
1.151 |
Diffraction radiation probe |
x-ray |
Diffraction radiation wavelength |
0.71073 Å |
Diffraction radiation type |
MoKα |
Has coordinates |
Yes |
Has disorder |
Yes |
Has Fobs |
No |
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https://www.crystallography.net/7708405.html