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Information card for entry 7708964
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Coordinates | 7708964.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | 2b' |
---|---|
Formula | C42 H54 N4 O2 Sn |
Calculated formula | C42 H54 N4 O2 Sn |
SMILES | [Sn]123Oc4c(cc(cc4C=[N]2[C@@H]([C@H]([NH]3Cc2ncccc2)c2cc(C(C)(C)C)cc(C(C)(C)C)c2O1)c1ncccc1)C(C)(C)C)C(C)(C)C.[Sn]123Oc4c(cc(cc4C=[N]2[C@H]([C@@H]([NH]3Cc2ncccc2)c2cc(C(C)(C)C)cc(C(C)(C)C)c2O1)c1ncccc1)C(C)(C)C)C(C)(C)C |
Title of publication | Complexity of imine and amine Schiff-base tin(ii) complexes: drastic differences of amino and pyridyl side arms |
Authors of publication | Yimthachote, Supajittra; Chumsaeng, Phongnarin; Phomphrai, Khamphee |
Journal of publication | Dalton Transactions |
Year of publication | 2021 |
a | 15.197 ± 0.0012 Å |
b | 15.6665 ± 0.001 Å |
c | 19.2301 ± 0.0015 Å |
α | 90° |
β | 91.923 ± 0.003° |
γ | 90° |
Cell volume | 4575.8 ± 0.6 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0273 |
Residual factor for significantly intense reflections | 0.0225 |
Weighted residual factors for significantly intense reflections | 0.0542 |
Weighted residual factors for all reflections included in the refinement | 0.056 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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Users of the data should acknowledge the original authors of the
structural data.