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Information card for entry 7708999
Preview
| Coordinates | 7708999.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Chemical name | xstr1155 |
|---|---|
| Formula | C36 H52 Al Cl N2 O4 |
| Calculated formula | C36 H52 Al Cl N2 O4 |
| SMILES | Cl[Al]12(OC(=CC(=[N]1c1c(cccc1C(C)C)C(C)C)C)OCC)OC(=CC(=[N]2c1c(cccc1C(C)C)C(C)C)C)OCC |
| Title of publication | Investigations into the structure, reactivity, and AACVD of aluminium and gallium amidoenoate complexes. |
| Authors of publication | Mears, Kristian L.; Bhide, Malavika A.; Knapp, Caroline E.; Carmalt, Claire J. |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2021 |
| Journal volume | 51 |
| Journal issue | 1 |
| Pages of publication | 156 - 167 |
| a | 8.9081 ± 0.0001 Å |
| b | 23.8108 ± 0.0002 Å |
| c | 16.8695 ± 0.0002 Å |
| α | 90° |
| β | 96.865 ± 0.001° |
| γ | 90° |
| Cell volume | 3552.52 ± 0.07 Å3 |
| Cell temperature | 150 ± 0.1 K |
| Ambient diffraction temperature | 150 ± 0.01 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.044 |
| Residual factor for significantly intense reflections | 0.0393 |
| Weighted residual factors for significantly intense reflections | 0.1027 |
| Weighted residual factors for all reflections included in the refinement | 0.1072 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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