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Information card for entry 7709178
Preview
Coordinates | 7709178.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C66 H92 Cl Ga2 N4 O P |
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Calculated formula | C66 H91 Cl Ga2 N4 O P |
SMILES | [Ga]1(Cl)(P[Ga]2(Oc3c(cccc3C)C)N(C(=CC(=[N]2c2c(cccc2C(C)C)C(C)C)C)C)c2c(cccc2C(C)C)C(C)C)N(C(=CC(=[N]1c1c(cccc1C(C)C)C(C)C)C)C)c1c(cccc1C(C)C)C(C)C |
Title of publication | Selective 1,2 addition of polar X-H bonds to the Ga-P double bond of gallaphosphene L(Cl)GaPGaL. |
Authors of publication | Sharma, Mahendra K.; Wölper, Christoph; Schulz, Stephan |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2022 |
Journal volume | 51 |
Journal issue | 4 |
Pages of publication | 1612 - 1616 |
a | 21.415 ± 0.002 Å |
b | 39.087 ± 0.004 Å |
c | 16.2869 ± 0.0017 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 13633 ± 2 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 7 |
Space group number | 45 |
Hermann-Mauguin space group symbol | I b a 2 |
Hall space group symbol | I 2 -2c |
Residual factor for all reflections | 0.04 |
Residual factor for significantly intense reflections | 0.0316 |
Weighted residual factors for significantly intense reflections | 0.0878 |
Weighted residual factors for all reflections included in the refinement | 0.092 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7709178.html
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