Information card for entry 7709404

Structure parameters

• Formula: C20 H40 N4 Si4 Sn
• Calculated formula: C20 H40 N4 Si4 Sn
• SMILES: [Sn]1([N]([Si](C)(C)C)=C(N1[Si](C)(C)C)c1cc(C#N)ccc1)N([Si](C)(C)C)[Si](C)(C)C
• Title of publication: Reversible addition of tin(II) amides to nitriles.
• Authors of publication: Chlupatý, Tomáš; Brichová, Kristýna; Samsonov, Maksim A.; R°užičková, Zdeňka; R°užička, Aleš
• Journal of publication: Dalton transactions (Cambridge, England : 2003)
• Year of publication: 2022
• Journal volume: 51
• Journal issue: 5
• Pages of publication: 1879 - 1887
• a: 10.162 ± 0.0004 Å
• b: 11.219 ± 0.0006 Å
• c: 14.3991 ± 0.001 Å
• α: 68.279 ± 0.005°
• β: 73.507 ± 0.004°
• γ: 80.199 ± 0.004°
• Cell volume: 1458.38 ± 0.15 ų
• Cell temperature: 150 ± 1 K
• Ambient diffraction temperature: 150 ± 1 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0521
• Residual factor for significantly intense reflections: 0.0423
• Weighted residual factors for significantly intense reflections: 0.0949
• Weighted residual factors for all reflections included in the refinement: 0.0992
• Goodness-of-fit parameter for all reflections included in the refinement: 1.233
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No