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Information card for entry 7709435
Preview
Coordinates | 7709435.cif |
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Original paper (by DOI) | HTML |
Formula | C67 H100 N8 Si12 |
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Calculated formula | C67 H100 N8 Si12 |
SMILES | [Si]12=[Si]([Si]3([Si]1([Si]([Si]23N([Si](C)(C)C)c1ccccc1)(N([Si](C)(C)C)c1ccccc1)N([Si](C)(C)C)c1ccccc1)N([Si](C)(C)C)c1ccccc1)N([Si](C)(C)C)c1ccccc1)(N([Si](C)(C)C)c1ccccc1)[n]1ccc(N(C)C)cc1.c1ccccc1 |
Title of publication | A strongly twisted SiSi bond with resemblance to a buckled dimer in an unexpected isomer of hexasilabenzene. |
Authors of publication | Helmer, Joschua; Hepp, Alexander; Lips, Felicitas |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2022 |
Journal volume | 51 |
Journal issue | 8 |
Pages of publication | 3254 - 3262 |
a | 13.8395 ± 0.0004 Å |
b | 19.0594 ± 0.0006 Å |
c | 28.7819 ± 0.0009 Å |
α | 90° |
β | 99.67 ± 0.002° |
γ | 90° |
Cell volume | 7484 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0502 |
Residual factor for significantly intense reflections | 0.0441 |
Weighted residual factors for significantly intense reflections | 0.1188 |
Weighted residual factors for all reflections included in the refinement | 0.1233 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.106 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7709435.html
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