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Information card for entry 7711984
Preview
| Coordinates | 7711984.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C25 H42 B P |
|---|---|
| Calculated formula | C25 H42 B P |
| SMILES | [P]1(Cc2c(cccc2)[B]1(C1CCCCC1)C1CCCCC1)(C(C)C)C(C)C |
| Title of publication | Frustrated Lewis pair-ligated tetrelenes. |
| Authors of publication | Omaña, Alvaro A; Frenette, Brandon L.; Dornsiepen, Eike; Kobayashi, Ryo; Ferguson, Michael J.; Iwamoto, Takeaki; Rivard, Eric |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2023 |
| Journal volume | 52 |
| Journal issue | 3 |
| Pages of publication | 774 - 786 |
| a | 10.7112 ± 0.0004 Å |
| b | 11.6101 ± 0.0004 Å |
| c | 18.4751 ± 0.0006 Å |
| α | 90° |
| β | 90.838 ± 0.001° |
| γ | 90° |
| Cell volume | 2297.28 ± 0.14 Å3 |
| Cell temperature | 173.15 K |
| Ambient diffraction temperature | 173.15 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.05 |
| Residual factor for significantly intense reflections | 0.0377 |
| Weighted residual factors for significantly intense reflections | 0.0927 |
| Weighted residual factors for all reflections included in the refinement | 0.0997 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.028 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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