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Information card for entry 7712177
Preview
Coordinates | 7712177.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H34 F12 N8 O2 P2 Ru |
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Calculated formula | C40 H34 F12 N8 O2 P2 Ru |
SMILES | c1c[n]2c3c(c1NCCO)ccc1c(cc[n](c31)[Ru]132([n]2cccc4ccc5ccc[n]1c5c24)[n]1cccc2ccc4ccc[n]3c4c12)NCCO.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-] |
Title of publication | An aggregation induced emission active bis-heteroleptic ruthenium(II) complex for luminescence light-up detection of pyrophosphate ions. |
Authors of publication | Patra, Sumit Kumar; Rabha, Monosh; Sen, Bhaskar; Aguan, Kripamoy; Khatua, Snehadrinarayan |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2023 |
Journal volume | 52 |
Journal issue | 9 |
Pages of publication | 2592 - 2602 |
a | 12.766 ± 0.004 Å |
b | 29.689 ± 0.008 Å |
c | 15.064 ± 0.004 Å |
α | 89.982 ± 0.008° |
β | 101.429 ± 0.008° |
γ | 90.015 ± 0.009° |
Cell volume | 5596 ± 3 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.4986 |
Residual factor for significantly intense reflections | 0.2246 |
Weighted residual factors for significantly intense reflections | 0.458 |
Weighted residual factors for all reflections included in the refinement | 0.5491 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.2 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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