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Information card for entry 7712416
Preview
Coordinates | 7712416.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C40 H48 F4 N4 O6 Zn2 |
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Calculated formula | C40 H48 F4 N4 O6 Zn2 |
SMILES | [Zn]1234Oc5c(F)cccc5C[NH]3[C@H]3CCCC[C@@H]3[NH]4Cc3cccc(F)c3[O]1[Zn]134[O]2c2c(F)cccc2C[NH]3[C@H]2CCCC[C@@H]2[NH]4Cc2cccc(F)c2O1.O.O |
Title of publication | Fluorine-based Zn salan complexes |
Authors of publication | Essien, Nsikak B.; Galvácsi , Antal Tamás; Kállay, Csilla; Al-Hilaly, Youssra Kareem; Gonzalez-Mendez, Ramon; Akien, Geoffrey; Tizzard, Graham J.; Coles, Simon; Besora, Maria; Kostakis, George E. |
Journal of publication | Dalton Transactions |
Year of publication | 2023 |
a | 8.12372 ± 0.00016 Å |
b | 10.6734 ± 0.0002 Å |
c | 12.4777 ± 0.0003 Å |
α | 64.9809 ± 0.0019° |
β | 75.1697 ± 0.0017° |
γ | 78.0265 ± 0.0016° |
Cell volume | 941.64 ± 0.04 Å3 |
Cell temperature | 100 ± 0.1 K |
Ambient diffraction temperature | 100 ± 0.1 K |
Number of distinct elements | 6 |
Space group number | 1 |
Hermann-Mauguin space group symbol | P 1 |
Hall space group symbol | P 1 |
Residual factor for all reflections | 0.0551 |
Residual factor for significantly intense reflections | 0.0538 |
Weighted residual factors for significantly intense reflections | 0.1386 |
Weighted residual factors for all reflections included in the refinement | 0.1397 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7712416.html
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