Information card for entry 7713011

Structure parameters

• Formula: C16 H26 Cl2 Hf Si2
• Calculated formula: C16 H26 Cl2 Hf Si2
• SMILES: [Hf]12345678(Cl)(Cl)([c]9([cH]4[cH]3[cH]2[cH]19)[Si](C)(C)C)[c]1([cH]8[cH]7[cH]6[cH]51)[Si](C)(C)C
• Title of publication: Comparison of group 4 and thorium M(IV) substituted cyclopentadienyl silanide complexes
• Authors of publication: Réant, Benjamin Luke Leonard; De Alwis Jayasinghe, Dukula Prathapa Bilesha; Wooles, Ashley; Liddle, Stephen; Mills, David P.
• Journal of publication: Dalton Transactions
• Year of publication: 2023
• a: 6.7742 ± 0.0007 Å
• b: 12.8385 ± 0.0008 Å
• c: 12.857 ± 0.0008 Å
• α: 68.257 ± 0.006°
• β: 75.092 ± 0.008°
• γ: 81.994 ± 0.007°
• Cell volume: 1002.46 ± 0.15 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0723
• Residual factor for significantly intense reflections: 0.0695
• Weighted residual factors for significantly intense reflections: 0.2064
• Weighted residual factors for all reflections included in the refinement: 0.2089
• Goodness-of-fit parameter for all reflections included in the refinement: 1.163
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No