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Information card for entry 7713016
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Coordinates | 7713016.cif |
---|---|
Original paper (by DOI) | HTML |
Chemical name | [Hf(Cp')2(C3H5){Si(SiMe3)3}] |
---|---|
Formula | C28 H58 Hf Si6 |
Calculated formula | C28 H58 Hf Si6 |
SMILES | [Hf]123456789%10([Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)([CH2]=[CH]1C2)([c]1([cH]6[cH]5[cH]4[cH]31)[Si](C)(C)C)[c]1([Si](C)(C)C)[cH]7[cH]8[cH]9[cH]%101 |
Title of publication | Comparison of group 4 and thorium M(IV) substituted cyclopentadienyl silanide complexes |
Authors of publication | Réant, Benjamin Luke Leonard; De Alwis Jayasinghe, Dukula Prathapa Bilesha; Wooles, Ashley; Liddle, Stephen; Mills, David P. |
Journal of publication | Dalton Transactions |
Year of publication | 2023 |
a | 9.3391 ± 0.0003 Å |
b | 32.143 ± 0.001 Å |
c | 11.9936 ± 0.0005 Å |
α | 90° |
β | 96.875 ± 0.003° |
γ | 90° |
Cell volume | 3574.4 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 4 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0638 |
Residual factor for significantly intense reflections | 0.0519 |
Weighted residual factors for significantly intense reflections | 0.1093 |
Weighted residual factors for all reflections included in the refinement | 0.1156 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.066 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/7713016.html
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