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Information card for entry 7713575
Preview
| Coordinates | 7713575.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C24 H48 Er N3 O3 |
|---|---|
| Calculated formula | C24 H48 Er N3 O3 |
| SMILES | [Er]123(OC(=C[N]1(C)C)C(C)(C)C)(OC(=C[N]3(C)C)C(C)(C)C)OC(=C[N]2(C)C)C(C)(C)C |
| Title of publication | Thermal atomic layer deposition of Er2O3 films from a volatile, thermally stable enaminolate precursor |
| Authors of publication | Jayakodiarachci, Navoda; Liu, Rui; Dharmadasa, Chamod; Hu, Xiaobing; Savage, Don; Ward, Cassandra L.; Evans, Paul G.; Winter, Charles |
| Journal of publication | Dalton Transactions |
| Year of publication | 2023 |
| a | 9.8012 ± 0.0007 Å |
| b | 21.698 ± 0.0015 Å |
| c | 14.4627 ± 0.0011 Å |
| α | 90° |
| β | 108.316 ± 0.003° |
| γ | 90° |
| Cell volume | 2919.9 ± 0.4 Å3 |
| Cell temperature | 102 K |
| Ambient diffraction temperature | 102 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.019 |
| Residual factor for significantly intense reflections | 0.0164 |
| Weighted residual factors for significantly intense reflections | 0.0358 |
| Weighted residual factors for all reflections included in the refinement | 0.0366 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.033 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/7713575.html
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