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Information card for entry 7715403
Preview
| Coordinates | 7715403.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C7.8 H27 In3 N5.4 S8 Sn |
|---|---|
| Calculated formula | In3 S8 Sn |
| Title of publication | (C<sub>6</sub>H<sub>15</sub>N<sub>3</sub>)<sub>1.3</sub>(NH<sub>4</sub>)<sub>1.5</sub>H<sub>1.5</sub>In<sub>3</sub>SnS<sub>8</sub>: a layered metal sulfide based on supertetrahedral T2 clusters with photoelectric response and ion exchange properties. |
| Authors of publication | Yang, Lu; Wen, Xin; Yang, Tian; Hu, Qian-Qian; Liu, Jia-Ting; Yin, Hai-Yan; Ablez, Abdusalam; Feng, Mei-Ling; Huang, Xiao-Ying |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 13 |
| Pages of publication | 6063 - 6069 |
| a | 11.0236 ± 0.0003 Å |
| b | 11.024 ± 0.0003 Å |
| c | 21.0862 ± 0.0006 Å |
| α | 90° |
| β | 97.75 ± 0.002° |
| γ | 90° |
| Cell volume | 2539.08 ± 0.12 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0474 |
| Residual factor for significantly intense reflections | 0.0408 |
| Weighted residual factors for significantly intense reflections | 0.1049 |
| Weighted residual factors for all reflections included in the refinement | 0.1089 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.182 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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