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Information card for entry 7715412
Preview
Coordinates | 7715412.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C98 H88 N2 O6 Pr Si4 |
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Calculated formula | C98 H88 N2 O6 Pr Si4 |
SMILES | [Pr]1(O[Si](c2ccccc2)(c2ccccc2)c2ccccc2)(O[Si](c2ccccc2)(c2ccccc2)c2ccccc2)(O[Si](c2ccccc2)(c2ccccc2)c2ccccc2)(O[Si](c2ccccc2)(c2ccccc2)c2ccccc2)[n]2ccc(OC)cc2c2[n]1ccc(OC)c2.c1ccc(cc1)C.c1cc(ccc1)C |
Title of publication | A tetravalent praseodymium complex with field-induced slow magnetic relaxation. |
Authors of publication | Xue, Tianjiao; Ding, You-Song; Zheng, Zhiping |
Journal of publication | Dalton transactions (Cambridge, England : 2003) |
Year of publication | 2024 |
Journal volume | 53 |
Journal issue | 13 |
Pages of publication | 5779 - 5783 |
a | 19.0038 ± 0.0011 Å |
b | 18.2175 ± 0.0009 Å |
c | 24.5942 ± 0.0012 Å |
α | 90° |
β | 102.266 ± 0.002° |
γ | 90° |
Cell volume | 8320.2 ± 0.8 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0752 |
Residual factor for significantly intense reflections | 0.0522 |
Weighted residual factors for significantly intense reflections | 0.1071 |
Weighted residual factors for all reflections included in the refinement | 0.1179 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.06 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/7715412.html
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