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Information card for entry 7716792
Preview
| Coordinates | 7716792.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C14 H22 O6 Pd |
|---|---|
| Calculated formula | C14 H22 O6 Pd |
| Title of publication | New palladium(II) β-ketoesterates for focused electron beam induced deposition: synthesis, structures, and characterization. |
| Authors of publication | Butrymowicz-Kubiak, A; Muzioł, T M; Kaczmarek-Kędziera, A; Jureddy, C. S.; Maćkosz, K; Utke, I.; Szymańska, I B |
| Journal of publication | Dalton transactions (Cambridge, England : 2003) |
| Year of publication | 2024 |
| Journal volume | 53 |
| Journal issue | 32 |
| Pages of publication | 13662 - 13677 |
| a | 4.35329 ± 0.0001 Å |
| b | 10.3794 ± 0.0003 Å |
| c | 17.7657 ± 0.0005 Å |
| α | 90° |
| β | 93.392 ± 0.002° |
| γ | 90° |
| Cell volume | 801.33 ± 0.04 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0384 |
| Residual factor for significantly intense reflections | 0.0346 |
| Weighted residual factors for significantly intense reflections | 0.0948 |
| Weighted residual factors for all reflections included in the refinement | 0.0981 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.112 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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