Information card for entry 8000068

Structure parameters

• Formula: C15 H25 O Si2 Ta
• Calculated formula: C15 H25 O Si2 Ta
• SMILES: [Ta]123456789([Si]([O]([Si]1(C)C)C)(C)C)([cH]1[cH]5[cH]4[cH]3[cH]21)[cH]1[cH]6[cH]7[cH]8[cH]91
• Title of publication: Synthesis and Structure of a Base-stabilized Silyl(silylene)tantalum Complex
• Authors of publication: Hidenori Koshikawa; Masaaki Okazaki; Shun-ichi Matsumoto; Keiji Ueno; Hiromi Tobita; Hiroshi Ogino
• Journal of publication: Chemistry Letters
• Year of publication: 2005
• Journal volume: 34
• Journal issue: 10
• Pages of publication: 1412
• a: 8.09 ± 0.001 Å
• b: 13.081 ± 0.002 Å
• c: 17.396 ± 0.002 Å
• α: 90°
• β: 102.482 ± 0.009°
• γ: 90°
• Cell volume: 1797.4 ± 0.5 ų
• Cell temperature: 150.2 K
• Number of distinct elements: 5
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/n 1
• Hall space group symbol: -P 2yn
• Residual factor for significantly intense reflections: 0.0303
• Weighted residual factors for all reflections included in the refinement: 0.0882
• Goodness-of-fit parameter for all reflections included in the refinement: 1.213
• Diffraction radiation wavelength: 0.7107 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No