Information card for entry 8000285
| Formula |
C54 H34 N2 O |
| Calculated formula |
C54 H34 N2 O |
| SMILES |
O=C(c1ccc(c2c3ccccc3c(c3c2cccc3)c2ccc(c3n(c4c(n3)c3c(cccc3)c3c4cccc3)c3ccccc3)cc2)cc1)c1ccccc1 |
| Title of publication |
Fine Modulation of the Higher-Order Excitonic States toward More Efficient Conversion from Upper-Level Triplet to Singlet. |
| Authors of publication |
Xu, Yuwei; Wang, Cong; Zhou, Xuehong; Zhou, Jiadong; Guo, Xiaomin; Liang, Xiaoming; Hu, Dehua; Li, Feng; Ma, Dongge; Ma, Yuguang |
| Journal of publication |
The journal of physical chemistry letters |
| Year of publication |
2019 |
| Pages of publication |
6878 - 6884 |
| a |
21.349 ± 0.0009 Å |
| b |
5.8099 ± 0.0002 Å |
| c |
31.5108 ± 0.0013 Å |
| α |
90° |
| β |
109.762 ± 0.004° |
| γ |
90° |
| Cell volume |
3678.3 ± 0.3 Å3 |
| Cell temperature |
99.9 ± 0.7 K |
| Ambient diffraction temperature |
99.9 ± 0.7 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0768 |
| Residual factor for significantly intense reflections |
0.0674 |
| Weighted residual factors for significantly intense reflections |
0.1795 |
| Weighted residual factors for all reflections included in the refinement |
0.1897 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.031 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
1.54184 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/8000285.html