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Information card for entry 8101705
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Coordinates | 8101705.cif |
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External links | ChemSpider |
Chemical name | 1,2-bis[bis(trimethylsilyl)amino]-1,2-dimethyl-1,2-diphenyl-disilane |
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Formula | C26 H52 N2 Si6 |
Calculated formula | C26 H52 N2 Si6 |
SMILES | [Si]([Si](N([Si](C)(C)C)[Si](C)(C)C)(C)c1ccccc1)(N([Si](C)(C)C)[Si](C)(C)C)(C)c1ccccc1 |
Title of publication | Crystal structure of 1,2-bis[bis(trimethylsilyl)amino]-1,2-dimethyl- 1,2-diphenyl-disilane, [{[(CH~3~)~3~Si]~2~N}(CH~3~)(C~6~H~5~)Si]~2~ |
Authors of publication | E. Popowski; I. Rietz; H. Reinke; M. Köckerling |
Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
Year of publication | 2005 |
Journal volume | 220 |
Journal issue | 1 |
Pages of publication | 83 - 84 |
a | 11.179 ± 0.001 Å |
b | 11.907 ± 0.001 Å |
c | 14.761 ± 0.002 Å |
α | 88.94 ± 0.01° |
β | 78.8 ± 0.01° |
γ | 64.14 ± 0.01° |
Cell volume | 1729.5 ± 0.4 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1331 |
Residual factor for significantly intense reflections | 0.0683 |
Weighted residual factors for significantly intense reflections | 0.1486 |
Weighted residual factors for all reflections included in the refinement | 0.1801 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.009 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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