Information card for entry 8101890

Structure parameters

• Chemical name: 1,1,4,4-tetramethyl-2,2,3,3-tetraphenyl-tetrasilane
• Formula: C28 H34 Si4
• Calculated formula: C28 H34 Si4
• SMILES: [SiH]([Si]([Si]([SiH](C)C)(c1ccccc1)c1ccccc1)(c1ccccc1)c1ccccc1)(C)C
• Title of publication: Crystal structure of 1,1,4,4-tetramethyl-2,2,3,3-tetraphenyl-tetrasilane, [(CH~3~)~2~(H)Si(C~6~H~5~)~2~Si]~2~
• Authors of publication: Harloff, J.; Reinke, H.; Köckerling, M.; Popowski, E.
• Journal of publication: Zeitschrift für Kristallographie - New Crystal Structures
• Year of publication: 2005
• Journal volume: 220
• Journal issue: 4
• Pages of publication: 627 - 628
• a: 10.149 ± 0.002 Å
• b: 10.712 ± 0.002 Å
• c: 15.148 ± 0.003 Å
• α: 85.51 ± 0.01°
• β: 88.99 ± 0.02°
• γ: 62.45 ± 0.01°
• Cell volume: 1455.3 ± 0.5 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 3
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0664
• Residual factor for significantly intense reflections: 0.0487
• Weighted residual factors for significantly intense reflections: 0.127
• Weighted residual factors for all reflections included in the refinement: 0.1397
• Goodness-of-fit parameter for all reflections included in the refinement: 1.044
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No