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Information card for entry 8101900
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| Coordinates | 8101900.cif |
|---|
| Chemical name | bis(N-ethylpyridinium) bis(2-thioxo-1,3-dithiole-4,5-dithiolato)mercurate(II) |
|---|---|
| Formula | C20 H20 Hg N2 S10 |
| Calculated formula | C20 H20 Hg N2 S10 |
| Title of publication | Crystal structure of bis(N-ethylpyridinium) bis(2-thioxo-1,3-dithiole- 4,5-dithiolato)mercurate(II), (C~7~H~10~N)~2~[Hg(C~3~S~5~)~2~] |
| Authors of publication | Wang, Y.-L.; Yu, W.-T.; Xu, D.; Wang, X.-Q.; Guo, W.-F.; Zhang, G.-H. |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2006 |
| Journal volume | 221 |
| Journal issue | 1 |
| Pages of publication | 27 - 28 |
| a | 20.286 ± 0.004 Å |
| b | 14.598 ± 0.003 Å |
| c | 10.0065 ± 0.0019 Å |
| α | 90° |
| β | 104.964 ± 0.003° |
| γ | 90° |
| Cell volume | 2862.8 ± 1 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0401 |
| Residual factor for significantly intense reflections | 0.0338 |
| Weighted residual factors for significantly intense reflections | 0.0864 |
| Weighted residual factors for all reflections included in the refinement | 0.0906 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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