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Information card for entry 8101950
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Coordinates | 8101950.cif |
---|
Chemical name | cis-4-tert-butyl-2-(4-nitro-phenylsulfonyl)cyclohexanone |
---|---|
Formula | C16 H21 N O5 S |
Calculated formula | C16 H21 N O5 S |
SMILES | S(=O)(=O)([C@@H]1C(=O)CC[C@@H](C1)C(C)(C)C)c1ccc(N(=O)=O)cc1.S(=O)(=O)([C@H]1C(=O)CC[C@H](C1)C(C)(C)C)c1ccc(N(=O)=O)cc1 |
Title of publication | Crystal structure of cis-4-tert-butyl-2-(4-nitrophenylsulfonyl)cyclohexanone, C~16~H~21~NO~5~S |
Authors of publication | Zukerman-Schpector, J.; Maganhi, S.; Olivato, P. R.; Vinhato, E. |
Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
Year of publication | 2006 |
Journal volume | 221 |
Journal issue | 2 |
Pages of publication | 165 - 166 |
a | 7.3395 ± 0.0009 Å |
b | 11.103 ± 0.001 Å |
c | 11.391 ± 0.001 Å |
α | 107.933 ± 0.009° |
β | 95.12 ± 0.01° |
γ | 99.96 ± 0.01° |
Cell volume | 859.73 ± 0.16 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.1564 |
Residual factor for significantly intense reflections | 0.0622 |
Weighted residual factors for significantly intense reflections | 0.1669 |
Weighted residual factors for all reflections included in the refinement | 0.2176 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.005 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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