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Information card for entry 8102060
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Coordinates | 8102060.cif |
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Chemical name | bis[tetrakis(trimethylsilylmethyl)(μ-hydroxy)(p-nitrobenzoato)(μ^3^- oxo)ditin(IV)] |
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Formula | C46 H98 N2 O12 Si8 Sn4 |
Calculated formula | C46 H98 N2 O12 Si8 Sn4 |
Title of publication | Crystal structure of bis(tetrakis(trimethylsilylmethyl)-(μ- hydroxy)(p-nitrobenzoato)(μ^3^-oxo)ditin(IV)), [Sn~2~O(OH) (NO~2~C~6~H~4~COO){(CH~3~)~3~SiCH~2~}~4~]~2~ |
Authors of publication | Lei, T.; Wang, G.-Y.; Li, Z.-H.; Lin, S.; Fang, X.-N. |
Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
Year of publication | 2006 |
Journal volume | 221 |
Journal issue | 4 |
Pages of publication | 492 - 494 |
a | 12.2616 ± 0.0001 Å |
b | 12.4817 ± 0.0001 Å |
c | 14.1222 ± 0.0002 Å |
α | 110.191 ± 0.001° |
β | 100.408 ± 0.001° |
γ | 106.679 ± 0.001° |
Cell volume | 1846.74 ± 0.04 Å3 |
Cell temperature | 273 ± 2 K |
Ambient diffraction temperature | 273 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0451 |
Residual factor for significantly intense reflections | 0.0355 |
Weighted residual factors for significantly intense reflections | 0.0999 |
Weighted residual factors for all reflections included in the refinement | 0.1041 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.088 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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