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Information card for entry 8102072
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| Coordinates | 8102072.cif |
|---|---|
| External links | PubChem |
| Chemical name | (1,10-phenanthroline-κ^2^N,N')oxo(N-salicylideneisoleucinato- κ^3^O,N,O')vanadium(IV) |
|---|---|
| Formula | C25 H23 N3 O4 V |
| Calculated formula | C25 H23 N3 O4 V |
| Title of publication | Crystal structure of (1,10-phenanthroline-κ^2^N,N')oxo- (N-salicylideneisoleucinato-κ^3^O,N,O')vanadium(IV), VO(C~12~H~8~N~2~)(C~13~H~15~NO~3~) |
| Authors of publication | Li, L.-Z.; Jing, B.-Q.; Li, L.-W.; Xu, T. |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2006 |
| Journal volume | 221 |
| Journal issue | 4 |
| Pages of publication | 520 - 522 |
| a | 32.593 ± 0.011 Å |
| b | 32.593 ± 0.011 Å |
| c | 10.974 ± 0.004 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 10096 ± 6 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 148 |
| Hermann-Mauguin space group symbol | R -3 :H |
| Hall space group symbol | -R 3 |
| Residual factor for all reflections | 0.1534 |
| Residual factor for significantly intense reflections | 0.053 |
| Weighted residual factors for significantly intense reflections | 0.1164 |
| Weighted residual factors for all reflections included in the refinement | 0.152 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.989 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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