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Information card for entry 8102111
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Coordinates | 8102111.cif |
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Chemical name | μ-oxo-bis[σ-1,2-bis(trimethylsilyl)vinylhafnocene] benzene solvate |
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Formula | C42 H64 Hf2 O Si4 |
Calculated formula | C42 H64 Hf2 O Si4 |
Title of publication | Crystal structure of μ-oxo-bis(σ-1,2-bis(trimethylsilyl) vinylhafnocene) benzene solvate, [C~2~H{Si(CH~3~)~3~}~2~Hf(C~5~H~5~) ~2~]~2~O · C~6~H~6~ |
Authors of publication | Spannenberg, Anke; Beweries, Torsten; Bach, Marc A.; Rosenthal, Uwe |
Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
Year of publication | 2007 |
Journal volume | 222 |
Journal issue | 3 |
Pages of publication | 187 - 188 |
a | 11.442 ± 0.001 Å |
b | 9.7998 ± 0.0006 Å |
c | 19.8266 ± 0.0016 Å |
α | 90° |
β | 95.229 ± 0.007° |
γ | 90° |
Cell volume | 2213.9 ± 0.3 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0231 |
Residual factor for significantly intense reflections | 0.0173 |
Weighted residual factors for significantly intense reflections | 0.0362 |
Weighted residual factors for all reflections included in the refinement | 0.037 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.959 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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