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Information card for entry 8102232
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Coordinates | 8102232.cif |
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Chemical name | bis(tetraphenylphosphonium) tetrakis(ethane-1,2-dithiolato)trinickelate(II) ethane-1,2-dithiole solvate |
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Formula | C60 H68 Ni3 P2 S12 |
Calculated formula | C60 H68 Ni3 P2 S12 |
Title of publication | Crystal structure of bis(tetraphenylphosphonium) tetrakis(ethane-1,2-dithiolato)trinickelate(II) ethane-1,2-dithiole solvate, [(C6H5)4P]2[Ni3(SCH2CH2S)4)] · 2HSC2H4SH |
Authors of publication | Martin Köckerling; Gerald Henkel |
Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
Year of publication | 2008 |
Journal volume | 223 |
Journal issue | 1 |
Pages of publication | 102 |
a | 9.671 ± 0.003 Å |
b | 14.086 ± 0.004 Å |
c | 14.091 ± 0.004 Å |
α | 113.27 ± 0.02° |
β | 102.75 ± 0.02° |
γ | 104.52 ± 0.02° |
Cell volume | 1592.9 ± 0.9 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0518 |
Residual factor for significantly intense reflections | 0.0441 |
Weighted residual factors for significantly intense reflections | 0.1185 |
Weighted residual factors for all reflections included in the refinement | 0.1253 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.03 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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