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Information card for entry 8102902
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| Coordinates | 8102902.cif |
|---|
| Chemical name | octasodium europium bis(hexatellurodisilicate) |
|---|---|
| Formula | Eu2 Na8 Si4 Te12 |
| Calculated formula | Eu2 Na8 Si4 Te12 |
| Title of publication | Crystal structures of octasodium dieuropium(II) bis[hexa-tellurodisilicate], Na~8~Eu~2~[Si~2~Te~6~]~2~, octasodium dieuro- pium(II) bis[hexaselenodigermanate], Na~8~Eu~2~[Ge~2~Se~6~]~2~, and nonasodium samarium(III) bis[hexaselenodisilicate], Na~9~Sm[Si~2~Se~6~]~2~ |
| Authors of publication | Knaust, J. M.; Polyakova, L. A.; Dorhout, P. K. |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2005 |
| Journal volume | 220 |
| Journal issue | 3 |
| Pages of publication | 295 - 297 |
| a | 7.6481 ± 0.0011 Å |
| b | 13.2228 ± 0.0019 Å |
| c | 8.4385 ± 0.0012 Å |
| α | 90° |
| β | 107.667 ± 0.003° |
| γ | 90° |
| Cell volume | 813.1 ± 0.2 Å3 |
| Cell temperature | 298 ± 2 K |
| Ambient diffraction temperature | 298 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 12 |
| Hermann-Mauguin space group symbol | C 1 2/m 1 |
| Hall space group symbol | -C 2y |
| Residual factor for all reflections | 0.0479 |
| Residual factor for significantly intense reflections | 0.0292 |
| Weighted residual factors for significantly intense reflections | 0.0548 |
| Weighted residual factors for all reflections included in the refinement | 0.0593 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.003 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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