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Information card for entry 8105674
Preview
| Coordinates | 8105674.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C9 H6 F N O2 S |
|---|---|
| Calculated formula | C9 H6 F N O2 S |
| SMILES | S(=O)(=O)(F)/C=C/c1ccc(cc1)C#N |
| Title of publication | Crystal structure of (E)-2-(4-cyanophenyl)ethenesulfonyl fluoride, C9H6FNO2S |
| Authors of publication | Brasil, Edikarlos; Samipillai, Marivel; Govender, Thavendran; Kruger, Hendrik G.; Naicker, Tricia |
| Journal of publication | Zeitschrift für Kristallographie - New Crystal Structures |
| Year of publication | 2019 |
| Journal volume | 234 |
| Journal issue | 3 |
| Pages of publication | 441 - 442 |
| a | 7.2786 ± 0.0002 Å |
| b | 8.1014 ± 0.0003 Å |
| c | 16.1084 ± 0.0005 Å |
| α | 76.32 ± 0.001° |
| β | 87.918 ± 0.001° |
| γ | 80.784 ± 0.001° |
| Cell volume | 911 ± 0.05 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 99.99 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0319 |
| Residual factor for significantly intense reflections | 0.0298 |
| Weighted residual factors for significantly intense reflections | 0.0836 |
| Weighted residual factors for all reflections included in the refinement | 0.0857 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.052 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/8105674.html
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Users of the data should acknowledge the original authors of the
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