Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 42

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2300229 CIF
Paper
C8 H9 N O2P 1 21/a 112.88606; 9.38115; 7.10099
90; 115.701; 90
773.484Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300230 CIF
Paper
C8 H9 N O2P 1 21/a 112.88559; 9.38013; 7.10096
90; 115.7; 90
773.38Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300231 CIF
Paper
C8 H9 N O2P 1 21/a 112.8865; 9.3822; 7.10147
90; 115.702; 90
773.65Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300232 CIF
Paper
C8 H9 N O2P 1 21/a 112.89; 9.38466; 7.10325
90; 115.702; 90
774.26Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300233 CIF
Paper
C8 H9 N O2P 1 21/a 112.8863; 9.38162; 7.10158
90; 115.701; 90
773.61Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300234 CIF
Paper
C8 H9 N O2P 1 21/a 112.8871; 9.3824; 7.1018
90; 115.703; 90
773.73Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300235 CIF
Paper
C8 H9 N O2P 1 21/a 112.8905; 9.38488; 7.10342
90; 115.701; 90
774.32Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300236 CIF
Paper
C8 H9 N O2P 1 21/a 112.887; 9.3819; 7.1015
90; 115.701; 90
773.66Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300237 CIF
Paper
C8 H9 N O2P 1 21/a 112.8858; 9.3812; 7.1013
90; 115.703; 90
773.5Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300238 CIF
Paper
C8 H9 N O2P 1 21/a 112.889; 9.38347; 7.10271
90; 115.702; 90
774.04Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300239 CIF
Paper
C8 H9 N O2P 1 21/a 112.8856; 9.3812; 7.10114
90; 115.697; 90
773.5Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300240 CIF
Paper
C8 H9 N O2P 1 21/a 112.8844; 9.3824; 7.1025
90; 115.709; 90
773.6Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300241 CIF
Paper
C8 H9 N O2P 1 21/a 112.8887; 9.384; 7.1025
90; 115.702; 90
774.05Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300242 CIF
Paper
C8 H9 N O2P 1 21/a 112.8869; 9.3833; 7.1022
90; 115.706; 90
773.82Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300243 CIF
Paper
C8 H9 N O2P 1 21/a 112.656; 9.564; 7.236
90; 117.1; 90
779.7Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300244 CIF
Paper
C8 H9 N O2P 1 21/a 112.885; 9.3862; 7.1008
90; 115.714; 90
773.8Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300245 CIF
Paper
C8 H9 N O2P 1 21/a 112.864; 9.354; 7.104
90; 115.83; 90
769.4Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300246 CIFCo Li O4 PP n m a10.202; 5.918; 4.709
90; 90; 90
284.3Kimura, Tsunehisa; Chang, Chengkang; Kimura, Fumiko; Maeyama, Masataka
The pseudo-single-crystal method: a third approach to crystal structure determination
Journal of Applied Crystallography, 2009, 42, 535-537
2300247 CIFDP 1 21/n 17.78366; 6.72568; 6.07443
90; 102.104; 90
310.929Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866
2300248 CIFDP b c a18.8679; 6.94772; 6.85885
90; 90; 90
899.12Fortes, A. D.; Wood, I. G.; Vočadlo, L.; Knight, K. S.; Marshall, W. G.; Tucker, M. G.; Fernandez-Alonso, F.
Phase behaviour and thermoelastic properties of perdeuterated ammonia hydrate and ice polymorphs from 0 to 2GPa
Journal of Applied Crystallography, 2009, 42, 846-866

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