Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 33

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9009663 CIFAl1.02 Ca0.02 Na0.98 O8 Si2.98C -18.14588; 12.7973; 7.15775
94.2451; 116.6; 87.8
665.342Gualtieri, A. F.
Accuracy of XRPD QPA using the combined Rietveld-RIR method
Journal of Applied Crystallography, 2000, 33, 267-278
9009664 CIFCa Fe0.25 Mg0.74 O6 Si2C 1 2/c 19.7504; 8.9015; 5.27444
90; 106.016; 90
440.016Gualtieri, A. F.
Accuracy of XRPD QPA using the combined Rietveld-RIR method
Journal of Applied Crystallography, 2000, 33, 267-278
9009665 CIFAl4 K O12 Si2C 1 2/c 15.2226; 9.0183; 20.143
90; 95.665; 90
944.081Gualtieri, A. F.
Accuracy of XRPD QPA using the combined Rietveld-RIR method
Journal of Applied Crystallography, 2000, 33, 267-278
9009666 CIFO2 SiP 31 2 14.9158; 4.9158; 5.4091
90; 90; 120
113.199Gualtieri, A. F.
Accuracy of XRPD QPA using the combined Rietveld-RIR method
Journal of Applied Crystallography, 2000, 33, 267-278

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