Crystallography Open Database
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Result: there are 12 entries in the selection
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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 32
COD ID | Links | Formula | Space group | Cell parameters | Cell volume | Bibliography |
---|---|---|---|---|---|---|
6000256 | CIF | C7 H5 Na O3 | P 1 21 1 | 16.0608; 5.3829; 3.6383 90; 92.869; 90 | 314.15 | Dinnebier, R. E.; von Dreele, R.; Stephens, P. W.; Jelonek, S.; Sieler, J. Structure of sodium para-hydroxybenzoate, NaO2C-C6H4OH by powder diffraction: application of a phenomenological model of anisotropic peak width Journal of Applied Crystallography, 1999, 32, 761-769 |
6000278 | CIF | C9 H9 N3 O2 S | P 1 21/n 1 | 14.3296; 15.2733; 10.4428 90; 91.052; 90 | 2285.13 | Chan, F. C.; Anwar, J.; Cernik, R.; Barnes, P.; Wilson, R. M. Ab initio structure determination of sulfathiazole polymorph v from synchrotron X-ray powder diffraction data Journal of Applied Crystallography, 1999, 32, 436-441 |
6000344 | CIF | C56 H50 O9 S3 | P 1 21/c 1 | 9.702; 18.623; 13.676 90; 91.18; 90 | 2470.46 | Kaduk, J. A.; Cahill, P. J.; Venkateshwaran, L. N. Crystal structures of a solvated and unsolvated sulfone cyclic oligomer Journal of Applied Crystallography, 1999, 32, 15-20 |
6000345 | CIF | C54 H44 O8 S2 | P 1 21/c 1 | 9.5703; 18.7582; 13.3945 90; 92.684; 90 | 2401.96 | Kaduk, J. A.; Cahill, P. J.; Venkateshwaran, L. N. Crystal structures of a solvated and unsolvated sulfone cyclic oligomer Journal of Applied Crystallography, 1999, 32, 15-20 |
9014297 | CIF | Mg2 O4 Si | P n m a | 10.20141; 5.98348; 4.75534 90; 90; 90 | 290.266 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo Journal of Applied Crystallography, 1999, 32, 51-59 |
9014320 | CIF | Mn2 O4 Si | P n m a | 10.60016; 6.25753; 4.90338 90; 90; 90 | 325.245 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Journal of Applied Crystallography, 1999, 32, 51-59 |
9015074 | CIF | Mg Mn O4 Si | P n m a | 10.451; 6.12446; 4.80757 90; 90; 90 | 307.717 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo Journal of Applied Crystallography, 1999, 32, 51-59 |
9015192 | CIF | Mg Mn O4 Si | P n m a | 10.451; 6.12446; 4.80757 90; 90; 90 | 307.717 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Journal of Applied Crystallography, 1999, 32, 51-59 |
9015658 | CIF | Mg2 O4 Si | P n m a | 10.20141; 5.98348; 4.75534 90; 90; 90 | 290.266 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Journal of Applied Crystallography, 1999, 32, 51-59 |
9015849 | CIF | Mn2 O4 Si | P n m a | 10.60016; 6.25753; 4.90338 90; 90; 90 | 325.245 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo Journal of Applied Crystallography, 1999, 32, 51-59 |
9016116 | CIF | Mg0.6 Mn1.4 O4 Si | P n m a | 10.52411; 6.17903; 4.83927 90; 90; 90 | 314.692 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo Journal of Applied Crystallography, 1999, 32, 51-59 |
9016435 | CIF | Mg0.6 Mn1.4 O4 Si | P n m a | 10.52411; 6.17903; 4.83927 90; 90; 90 | 314.692 | Yamazaki, S.; Toraya, H. Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1 Journal of Applied Crystallography, 1999, 32, 51-59 |
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