Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 32

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6000256 CIFC7 H5 Na O3P 1 21 116.0608; 5.3829; 3.6383
90; 92.869; 90
314.15Dinnebier, R. E.; von Dreele, R.; Stephens, P. W.; Jelonek, S.; Sieler, J.
Structure of sodium para-hydroxybenzoate, NaO2C-C6H4OH by powder diffraction: application of a phenomenological model of anisotropic peak width
Journal of Applied Crystallography, 1999, 32, 761-769
6000278 CIFC9 H9 N3 O2 SP 1 21/n 114.3296; 15.2733; 10.4428
90; 91.052; 90
2285.13Chan, F. C.; Anwar, J.; Cernik, R.; Barnes, P.; Wilson, R. M.
Ab initio structure determination of sulfathiazole polymorph v from synchrotron X-ray powder diffraction data
Journal of Applied Crystallography, 1999, 32, 436-441
6000344 CIFC56 H50 O9 S3P 1 21/c 19.702; 18.623; 13.676
90; 91.18; 90
2470.46Kaduk, J. A.; Cahill, P. J.; Venkateshwaran, L. N.
Crystal structures of a solvated and unsolvated sulfone cyclic oligomer
Journal of Applied Crystallography, 1999, 32, 15-20
6000345 CIFC54 H44 O8 S2P 1 21/c 19.5703; 18.7582; 13.3945
90; 92.684; 90
2401.96Kaduk, J. A.; Cahill, P. J.; Venkateshwaran, L. N.
Crystal structures of a solvated and unsolvated sulfone cyclic oligomer
Journal of Applied Crystallography, 1999, 32, 15-20
9014297 CIFMg2 O4 SiP n m a10.20141; 5.98348; 4.75534
90; 90; 90
290.266Yamazaki, S.; Toraya, H.
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo
Journal of Applied Crystallography, 1999, 32, 51-59
9014320 CIFMn2 O4 SiP n m a10.60016; 6.25753; 4.90338
90; 90; 90
325.245Yamazaki, S.; Toraya, H.
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1
Journal of Applied Crystallography, 1999, 32, 51-59
9015074 CIFMg Mn O4 SiP n m a10.451; 6.12446; 4.80757
90; 90; 90
307.717Yamazaki, S.; Toraya, H.
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo
Journal of Applied Crystallography, 1999, 32, 51-59
9015192 CIFMg Mn O4 SiP n m a10.451; 6.12446; 4.80757
90; 90; 90
307.717Yamazaki, S.; Toraya, H.
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1
Journal of Applied Crystallography, 1999, 32, 51-59
9015658 CIFMg2 O4 SiP n m a10.20141; 5.98348; 4.75534
90; 90; 90
290.266Yamazaki, S.; Toraya, H.
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1
Journal of Applied Crystallography, 1999, 32, 51-59
9015849 CIFMn2 O4 SiP n m a10.60016; 6.25753; 4.90338
90; 90; 90
325.245Yamazaki, S.; Toraya, H.
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo
Journal of Applied Crystallography, 1999, 32, 51-59
9016116 CIFMg0.6 Mn1.4 O4 SiP n m a10.52411; 6.17903; 4.83927
90; 90; 90
314.692Yamazaki, S.; Toraya, H.
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = eo
Journal of Applied Crystallography, 1999, 32, 51-59
9016435 CIFMg0.6 Mn1.4 O4 SiP n m a10.52411; 6.17903; 4.83927
90; 90; 90
314.692Yamazaki, S.; Toraya, H.
Rietveld refinement of site-occupancy parameters of Mg2-xMnxSiO4 using a new weight function in least-squares fitting Note: e = 1
Journal of Applied Crystallography, 1999, 32, 51-59

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