Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 34

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2300392 CIFC10 H16 N O1.5P 21 21 217.3188; 11.2018; 24.0156
90; 90; 90
1968.89Krebs, Frederik C.; Jørgensen, Mikkel; Lebech, Bente; Frydenvang, Karla
A perdeuterated cryoprotectant for neutron studies and a demonstration of its use for neutron powder diffraction onL-(−)-ephedrine hemihydrate
Journal of Applied Crystallography, 2001, 34, 203
2300393 CIFC10 H16 N O1.5P 21 21 217.3105; 11.1878; 23.979
90; 90; 90
1961.2Krebs, Frederik C.; Jørgensen, Mikkel; Lebech, Bente; Frydenvang, Karla
A perdeuterated cryoprotectant for neutron studies and a demonstration of its use for neutron powder diffraction onL-(−)-ephedrine hemihydrate
Journal of Applied Crystallography, 2001, 34, 203
2300442 CIFGd K O8 W2C 1 2/c 110.652; 10.374; 7.582
90; 130.8; 90
634.2Pujol, M. C.; Solé, R.; Massons, J.; Gavaldà, Jna.; Solans, X.; Zaldo, C.; Díaz, F.; Aguiló, M.
Structural study of monoclinic KGd(WO4)2and effects of lanthanide substitution
Journal of Applied Crystallography, 2001, 34, 1
2300443 CIFC12 H24 B2 F8 Fe N24P 1 21/n 117.566; 10.0964; 18.696
90; 114.458; 90
3018.3Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp
X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2
Journal of Applied Crystallography, 2001, 34, 229
2300444 CIFC12 H24 B2 F8 Fe N24P 1 21/n 117.4887; 10.0914; 18.517
90; 115.243; 90
2955.9Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp
X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2
Journal of Applied Crystallography, 2001, 34, 229
2300445 CIFC12 H24 B2 F8 Fe N24P 1 21/n 117.207; 10.214; 18.406
90; 113.912; 90
2957.2Kusz, Joachim; Spiering, Hartmut; Gütlich, Philipp
X-ray structure study of the light-induced metastable states of the spin-crossover compound [Fe(mtz)6](BF4)2
Journal of Applied Crystallography, 2001, 34, 229
2300522 CIFNb Te4P 4/m c c6.3616; 6.3616; 6.837
90; 90; 90
276.693Dusek, M.; Petricek, V.; Dinnebier, R.E.; Wunschel, M.; van Smaalen, S.
Refinement of modulated structures against X-ray powder diffraction data with JANA2000
Journal of Applied Crystallography, 2001, 34, 398-404
9017490 CIFFe0.23 Mg1.77 O4 SiP b n m4.764; 10.229; 5.996
90; 90; 90
292.191Heuer, M.
The determination of site occupancies using a new strategy in Rietveld refinements Note: for calculation of powder patterns
Journal of Applied Crystallography, 2001, 34, 271-279
9017491 CIFFe0.23 Mg1.77 O4 SiP b n m4.7645; 10.23467; 5.99727
90; 90; 90
292.445Heuer, M.
The determination of site occupancies using a new strategy in Rietveld refinements Note: results of the conventional Rietveld refinement on the whole data set
Journal of Applied Crystallography, 2001, 34, 271-279
9017492 CIFFe0.23 Mg1.77 O4 SiP b n m4.762; 10.235; 5.998
90; 90; 90
292.337Heuer, M.
The determination of site occupancies using a new strategy in Rietveld refinements Note: results of the conventional refinement on single-crystal data
Journal of Applied Crystallography, 2001, 34, 271-279

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