Crystallography Open Database

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Searching journal of publication like 'Journal of Applied Crystallography' volume of publication is 42

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2300209 CIF
Paper
C46 H42 Fe O12P 1 21 15.857; 24.105; 14.069
90; 93.15; 90
1983.3Okabe, Takashi; Nakazaki, Keisuke; Igaue, Tsuyoshi; Nakamura, Naotake; Donnio, Bertrand; Guillon, Daniel; Gallani, Jean-Louis
Synthesis and physical properties of ferrocene derivatives. XXI. Crystal structure of a liquid crystalline ferrocene derivative, 1,1'-bis[3-[4-(4-methoxyphenoxycarbonyl)phenoxy]propyloxycarbonyl]ferrocene
Journal of Applied Crystallography, 2009, 42, 63-68
2300210 CIF
HKL
Paper
C2 H2 Ca O5P 1 21/c 16.316; 14.541; 10.116
90; 109; 90
878.4Daudon, Michel; Bazin, Dominique; André, Gilles; Jungers, Paul; Cousson, Alain; Chevallier, Pierre; Véron, Emmanuel; Matzen, Guy
Examination of whewellite kidney stones by scanning electron microscopy and powder neutron diffraction techniques
Journal of Applied Crystallography, 2009, 42, 109-115
2300211 CIF
Paper
Lu2 O5 SiI 1 2/a 110.255; 6.6465; 12.3626
90; 102.422; 90
822.91Cong, Hengjiang; Zhang, Huaijin; Wang, Jiyang; Yu, Wentao; Fan, Jiandong; Cheng, Xiufeng; Sun, Shangqian; Zhang, Jian; Lu, Qingming; Jiang, Chunjian; Boughton, Robert I.
Structural and thermal properties of the monoclinic Lu~2~SiO~5~ single crystal: evaluation as a new laser matrix
Journal of Applied Crystallography, 2009, 42, 284-294
2300212 CIF
Paper
C13 H18 O2P 1 21/c 114.6696; 7.889; 10.7287
90; 99.427; 90
1224.85Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300213 CIF
Paper
C13 H18 O2P 1 21/c 114.6712; 7.8893; 10.7288
90; 99.428; 90
1225.05Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300214 CIF
Paper
C13 H18 O2P 1 21/c 114.6662; 7.8879; 10.7275
90; 99.432; 90
1224.23Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300215 CIF
Paper
C13 H18 O2P 1 21/c 114.6689; 7.8884; 10.728
90; 99.429; 90
1224.61Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300216 CIF
Paper
C13 H18 O2P 1 21/c 114.6682; 7.8889; 10.7276
90; 99.437; 90
1224.55Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300217 CIF
Paper
C13 H18 O2P 1 21/c 114.6636; 7.8871; 10.7244
90; 99.417; 90
1223.6Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300218 CIF
Paper
C13 H18 O2P 1 21/c 114.6703; 7.889; 10.7282
90; 99.429; 90
1224.84Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300219 CIF
Paper
C13 H18 O2P 1 21/c 114.6698; 7.8878; 10.7265
90; 99.432; 90
1224.41Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300220 CIF
Paper
C13 H18 O2P 1 21/c 114.499; 7.7576; 10.6203
90; 99.741; 90
1177.3Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300221 CIF
Paper
C13 H18 O2P 1 21/c 114.6706; 7.8885; 10.7284
90; 99.426; 90
1224.81Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300222 CIF
Paper
C13 H18 O2P 1 21/c 114.6655; 7.8817; 10.724
90; 99.427; 90
1222.8Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300223 CIF
Paper
C13 H18 O2P 1 21/c 114.494; 7.7528; 10.6655
90; 99.875; 90
1180.7Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300224 CIF
Paper
C13 H18 O2P 1 21/c 114.673; 7.8892; 10.7316
90; 99.436; 90
1225.45Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300225 CIF
Paper
C13 H18 O2P 1 21/c 114.669; 7.8804; 10.7272
90; 99.439; 90
1223.3Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300226 CIF
Paper
C13 H18 O2P 1 21/c 114.528; 7.7695; 10.691
90; 99.89; 90
1188.8Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300227 CIF
Paper
C13 H18 O2P 1 21/c 114.67; 7.8886; 10.7304
90; 99.43; 90
1225Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391
2300228 CIF
Paper
C13 H18 O2P 1 21/c 114.683; 7.86; 10.729
90; 99.456; 90
1221.4Stone, Kevin H.; Lapidus, Saul H.; Stephens, Peter W.
Implementation and use of robust refinement in powder diffraction in the presence of impurities
Journal of Applied Crystallography, 2009, 42, 385-391

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