Information card for entry 1520113
| Formula |
C24 H30 Ge Si |
| Calculated formula |
C24 H30 Ge Si |
| SMILES |
[Ge]([Si](C)(C)C)(c1ccc(cc1)C)(c1ccc(cc1)C)c1ccc(cc1)C |
| Title of publication |
Compounds of Group 14 Elements with an Element–Element (E = Si, Ge, Sn) Bond: Effect of the Nature of the Element Atom |
| Authors of publication |
Zaitsev, Kirill V.; Lermontova, Elmira Kh.; Churakov, Andrei V.; Tafeenko, Viktor A.; Tarasevich, Boris N.; Poleshchuk, Oleg Kh.; Kharcheva, Anastasia V.; Magdesieva, Tatiana V.; Nikitin, Oleg M.; Zaitseva, Galina S.; Karlov, Sergey S. |
| Journal of publication |
Organometallics |
| Year of publication |
2015 |
| Journal volume |
34 |
| Journal issue |
12 |
| Pages of publication |
2765 |
| a |
10.4814 ± 0.0006 Å |
| b |
19.1943 ± 0.0012 Å |
| c |
12.056 ± 0.0007 Å |
| α |
90° |
| β |
109.021 ± 0.001° |
| γ |
90° |
| Cell volume |
2293 ± 0.2 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0375 |
| Residual factor for significantly intense reflections |
0.0292 |
| Weighted residual factors for significantly intense reflections |
0.0717 |
| Weighted residual factors for all reflections included in the refinement |
0.0751 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.023 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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