Information card for entry 1520114
| Formula |
C24 H30 Ge2 |
| Calculated formula |
C24 H30 Ge2 |
| SMILES |
[Ge]([Ge](C)(C)C)(c1ccc(C)cc1)(c1ccc(C)cc1)c1ccc(C)cc1 |
| Title of publication |
Compounds of Group 14 Elements with an Element–Element (E = Si, Ge, Sn) Bond: Effect of the Nature of the Element Atom |
| Authors of publication |
Zaitsev, Kirill V.; Lermontova, Elmira Kh.; Churakov, Andrei V.; Tafeenko, Viktor A.; Tarasevich, Boris N.; Poleshchuk, Oleg Kh.; Kharcheva, Anastasia V.; Magdesieva, Tatiana V.; Nikitin, Oleg M.; Zaitseva, Galina S.; Karlov, Sergey S. |
| Journal of publication |
Organometallics |
| Year of publication |
2015 |
| Journal volume |
34 |
| Journal issue |
12 |
| Pages of publication |
2765 |
| a |
10.6888 ± 0.0002 Å |
| b |
19.3569 ± 0.0004 Å |
| c |
12.29 ± 0.0003 Å |
| α |
90° |
| β |
109.624 ± 0.002° |
| γ |
90° |
| Cell volume |
2395.13 ± 0.09 Å3 |
| Cell temperature |
295 ± 2 K |
| Ambient diffraction temperature |
295 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.076 |
| Residual factor for significantly intense reflections |
0.0436 |
| Weighted residual factors for significantly intense reflections |
0.1024 |
| Weighted residual factors for all reflections included in the refinement |
0.1111 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.831 |
| Diffraction radiation wavelength |
1.54186 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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