Information card for entry 1553413
| Common name |
TPT |
| Chemical name |
2,3,4,5-tetraphenylthiophene |
| Formula |
C28 H20 S |
| Calculated formula |
C28 H20 S |
| SMILES |
s1c(c(c(c1c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1 |
| Title of publication |
Tetraphenylfuran: aggregation-induced emission or aggregation-caused quenching? |
| Authors of publication |
Nie, Han; Hu, Kun; Cai, Yuanjing; Peng, Qian; Zhao, Zujin; Hu, Rongrong; Chen, Junwu; Su, Shi-Jian; Qin, Anjun; Tang, Ben Zhong |
| Journal of publication |
Materials Chemistry Frontiers |
| Year of publication |
2017 |
| Journal volume |
1 |
| Journal issue |
6 |
| Pages of publication |
1125 |
| a |
15.4081 ± 0.0005 Å |
| b |
6.0485 ± 0.0002 Å |
| c |
22.1271 ± 0.0007 Å |
| α |
90° |
| β |
102.299 ± 0.003° |
| γ |
90° |
| Cell volume |
2014.83 ± 0.12 Å3 |
| Cell temperature |
173 ± 0.3 K |
| Ambient diffraction temperature |
173.15 K |
| Number of distinct elements |
3 |
| Space group number |
5 |
| Hermann-Mauguin space group symbol |
I 1 2 1 |
| Hall space group symbol |
I 2y |
| Residual factor for all reflections |
0.0378 |
| Residual factor for significantly intense reflections |
0.0355 |
| Weighted residual factors for significantly intense reflections |
0.0832 |
| Weighted residual factors for all reflections included in the refinement |
0.0851 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.002 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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