Information card for entry 1553414
| Common name |
TPF |
| Chemical name |
2,3,4,5-tetraphenylfuran |
| Formula |
C28 H20 O |
| Calculated formula |
C28 H20 O |
| SMILES |
o1c(c(c(c1c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1 |
| Title of publication |
Tetraphenylfuran: aggregation-induced emission or aggregation-caused quenching? |
| Authors of publication |
Nie, Han; Hu, Kun; Cai, Yuanjing; Peng, Qian; Zhao, Zujin; Hu, Rongrong; Chen, Junwu; Su, Shi-Jian; Qin, Anjun; Tang, Ben Zhong |
| Journal of publication |
Materials Chemistry Frontiers |
| Year of publication |
2017 |
| Journal volume |
1 |
| Journal issue |
6 |
| Pages of publication |
1125 |
| a |
21.71 ± 0.007 Å |
| b |
8.16 ± 0.0015 Å |
| c |
24.855 ± 0.008 Å |
| α |
90° |
| β |
113.396 ± 0.019° |
| γ |
90° |
| Cell volume |
4041 ± 2 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
I 1 2/c 1 |
| Hall space group symbol |
-I 2yc |
| Residual factor for all reflections |
0.0489 |
| Residual factor for significantly intense reflections |
0.0378 |
| Weighted residual factors for significantly intense reflections |
0.1012 |
| Weighted residual factors for all reflections included in the refinement |
0.1095 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.052 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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