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Information card for entry 1559722
Preview
| Coordinates | 1559722.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H48 Cl Ir N2 Si |
|---|---|
| Calculated formula | C32 H48 Cl Ir N2 Si |
| SMILES | [Ir]123(Cl)([Si]4([N](=C(N4C(C)(C)C)c4ccccc4)C(C)(C)C)C4C(=C(C(=C4C)C)C)C)[CH]4=[CH]1CC[CH]2=[CH]3CC4 |
| Title of publication | A cyclopentadienyl functionalized silylene ‒ a flexible ligand for Si- and C-coordination |
| Authors of publication | Kaufmann, Sebastian; Krätschmer, Frederic; Köppe, Ralf; Schon, Thorben; Schoo, Christoph; Roesky, Peter W. |
| Journal of publication | Chemical Science |
| Year of publication | 2020 |
| Journal volume | 11 |
| Journal issue | 46 |
| Pages of publication | 12446 - 12452 |
| a | 33.271 ± 0.007 Å |
| b | 9.5771 ± 0.0019 Å |
| c | 19.943 ± 0.004 Å |
| α | 90° |
| β | 103.05 ± 0.03° |
| γ | 90° |
| Cell volume | 6191 ± 2 Å3 |
| Cell temperature | 150 K |
| Ambient diffraction temperature | 150 K |
| Number of distinct elements | 6 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.0342 |
| Residual factor for significantly intense reflections | 0.0224 |
| Weighted residual factors for significantly intense reflections | 0.0467 |
| Weighted residual factors for all reflections included in the refinement | 0.0484 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.956 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/1559722.html
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Users of the data should acknowledge the original authors of the
structural data.