Information card for entry 1574298

Structure parameters

• Formula: C41 H45 N2 O2 P S Si
• Calculated formula: C41 H45 N2 O2 P S Si
• SMILES: S(=O)(=O)(C1=P(c2c([Si@H]1N(/C(=N/C(C)(C)C)c1ccccc1)C(C)(C)C)cccc2)(c1ccccc1)c1ccccc1)c1ccc(cc1)C
• Title of publication: Base-stabilized acyclic amino(ylidyl)silylenes: electron-rich donors for the stabilization of silicon-element multiple bonds
• Authors of publication: Krischer, Felix; Mayer, Stephan; Hensle, Lennart; Knyszek, Daniel; Darmandeh, Heidar; Gessner, Viktoria H.
• Journal of publication: Chemical Science
• Year of publication: 2025
• Journal volume: 16
• Journal issue: 19
• Pages of publication: 8346 - 8356
• a: 9.8655 ± 0.0001 Å
• b: 10.6697 ± 0.0001 Å
• c: 17.5437 ± 0.0001 Å
• α: 90°
• β: 94.805 ± 0.001°
• γ: 90°
• Cell volume: 1840.19 ± 0.03 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 7
• Space group number: 4
• Hermann-Mauguin space group symbol: P 1 21 1
• Hall space group symbol: P 2yb
• Residual factor for all reflections: 0.028
• Residual factor for significantly intense reflections: 0.0276
• Weighted residual factors for significantly intense reflections: 0.0731
• Weighted residual factors for all reflections included in the refinement: 0.0734
• Goodness-of-fit parameter for all reflections included in the refinement: 1.015
• Diffraction radiation probe: x-ray
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No