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Information card for entry 1574299
Preview
| Coordinates | 1574299.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C36 H38 N3 P S2 Si |
|---|---|
| Calculated formula | C36 H38 N3 P S2 Si |
| SMILES | [Si]1(C(=P(c2ccccc2)(c2ccccc2)c2ccccc2)C#N)([N](=C(N1C(C)(C)C)c1ccccc1)C(C)(C)C)C(=S)[S-] |
| Title of publication | Base-stabilized acyclic amino(ylidyl)silylenes: electron-rich donors for the stabilization of silicon-element multiple bonds |
| Authors of publication | Krischer, Felix; Mayer, Stephan; Hensle, Lennart; Knyszek, Daniel; Darmandeh, Heidar; Gessner, Viktoria H. |
| Journal of publication | Chemical Science |
| Year of publication | 2025 |
| Journal volume | 16 |
| Journal issue | 19 |
| Pages of publication | 8346 - 8356 |
| a | 14.8143 ± 0.0001 Å |
| b | 14.4078 ± 0.0001 Å |
| c | 17.4032 ± 0.0002 Å |
| α | 90° |
| β | 114.35 ± 0.001° |
| γ | 90° |
| Cell volume | 3384.13 ± 0.06 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0352 |
| Residual factor for significantly intense reflections | 0.0326 |
| Weighted residual factors for significantly intense reflections | 0.0893 |
| Weighted residual factors for all reflections included in the refinement | 0.0913 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.051 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 1.54184 Å |
| Diffraction radiation type | CuKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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Users of the data should acknowledge the original authors of the
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