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Information card for entry 1574493
Preview
| Coordinates | 1574493.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C20 H31 Cl4 N4 P3 |
|---|---|
| Calculated formula | C20 H31 Cl4 N4 P3 |
| SMILES | C1(C(CC(C)(C)N1c1c(cccc1C(C)C)C(C)C)(C)C)=P1=NP(Cl)(Cl)=NP(Cl)(Cl)=N1 |
| Title of publication | Multi-site reduction of hexachlorophosphazene to low-valent PN heterocycles and extension to the reduction of poly-chlorophosphazene |
| Authors of publication | LaPierre, Etienne A.; Suvinen, Roope A.; Patrick, Brian O.; Tuononen, Heikki M.; Manners, Ian |
| Journal of publication | Chemical Science |
| Year of publication | 2025 |
| Journal volume | 16 |
| Journal issue | 22 |
| Pages of publication | 9820 - 9832 |
| a | 10.7944 ± 0.0004 Å |
| b | 14.744 ± 0.0006 Å |
| c | 17.168 ± 0.0007 Å |
| α | 90° |
| β | 108.135 ± 0.001° |
| γ | 90° |
| Cell volume | 2596.61 ± 0.18 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.0399 |
| Residual factor for significantly intense reflections | 0.0277 |
| Weighted residual factors for significantly intense reflections | 0.0665 |
| Weighted residual factors for all reflections included in the refinement | 0.0715 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.022 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/1574493.html
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Users of the data should acknowledge the original authors of the
structural data.